A Low Power Built-in Self-Test Scheme Based on Overlapping Bit Swapping Linear Feedback Shift Register.
Bin ZhouXin-chun WuYu SunTianqi WangLiyi XiaoPublished in: J. Low Power Electron. (2013)
Keyphrases
- shift register
- low power
- high speed
- single chip
- high power
- vlsi architecture
- random number generator
- logic circuits
- wireless transmission
- power consumption
- low cost
- digital signal processing
- real time
- low power consumption
- vlsi circuits
- mixed signal
- gate array
- vlsi implementation
- cmos technology
- hardware implementation
- signal processing