A new low power test pattern generator using a variable-length ring counter.

Bin Zhou Yizheng Ye Zhao-lin Li Xin-chun Wu Rui Ke

Published in: ISQED (2009)

Keyphrases

low power
variable length
pattern generator
fixed length
low cost
power consumption
high speed
logic circuits
low power consumption
n gram
bitstream
signal processing
cmos technology
gate array
entropy coding
power dissipation
information retrieval