Wei-Ting Kary Chien

Publication Activity (10 Years)

Years Active: 2003-2019
Publications (10 Years): 10

Top Topics

Quality Control

Reliability Assessment

Top Venues

Microelectron. Reliab.

IEEE Trans. Reliab.

Publications

Wei-Ting Kary Chien, Andrew Chung, Way Kuo
Fast Semiconductor Reliability Assessments Using SPRT. IEEE Trans. Reliab. 68 (2) (2019)
Wei-Ting Kary Chien, Atman Yong Zhao, Liwen Zhang, Zhijuan Wang
Investigations and detections on a new BEOL dielectric failure mechanism at advanced technologies. Microelectron. Reliab. 81 (2018)
Xiangfu Zhao, Wei-Ting Kary Chien
Exploration of baking temperature effects on 28 nm BEOL reliability. Microelectron. Reliab. 72 (2017)
Wei-Ting Kary Chien, Atman Yong Zhao, Yueqin Zhu, Yongliang Song
Early detection and prediction of HKMG SRAM HTOL performance by WLR PBTI tests. Microelectron. Reliab. 64 (2016)
Wei-Ting Kary Chien, Yueqin Zhu, Yongliang Song, Atman Yong Zhao
-based HKMG p-MOSFETs. Microelectron. Reliab. 64 (2016)
Hailin Jonson Gao, Xueliang Ruben Zhang, Yanju Lisa Yu, Kaiyuan Kevin Chang, Wei-Ting Kary Chien
The investigation of semiconductor shipping bag reliability. IEEM (2015)
John Qiao, Morn Jin, Wenwen He, Wei-Ting Kary Chien, Shirley Zhao
Comprehensive Wafer Level Package Die Processing Service quality control enhancement. IEEM (2015)
Morn Jin, Wenwen He, John Qiao, Wei-Ting Kary Chien, Shirley Zhao
Wafer level package wafer probing shift error-proof quality control. IEEM (2015)
Siyuan Frank Yang, Wei-Ting Kary Chien
Electromigration Lifetime Optimization by Uniform Designs and a New Lifetime Index. IEEE Trans. Reliab. 64 (4) (2015)
Wei-Ting Kary Chien, Atman Yong Zhao, Liwen Zhang, Flora Cheng
The reversed intrinsic curve and voltage dependence for ultra-low k dielectrics. IRPS (2015)
Taicheng Kevin Gong, Yanju Lisa Yu, Yan Kaily Cao, Xueliang Ruben Zhang, Kaiyuan Kevin Chang, Wei-Ting Kary Chien
A study on the optimization of wafer pre-treatment conditions for thin film stability monitor. IEEM (2014)
Wei-Ting Kary Chien, Ming Li
Editorial: Reduce Time-to-Market by Considering Reliability Tradeoffs. IEEE Trans. Reliab. 61 (4) (2012)
Wei-Ting Kary Chien, Siyuan Frank Yang
A Practical, Innovative Method for Electro-Static Discharge Data Analysis. IEEE Trans. Reliab. 59 (2) (2010)
Wei-Ting Kary Chien, Siyuan Frank Yang
A New Method to Determine the Reliability Comparability for Products, Components, and Systems in Reliability Testing. IEEE Trans. Reliab. 56 (1) (2007)
Summer F. C. Tseng, Wei-Ting Kary Chien, Excimer Gong, Willings Wang, Bing-Chu Cai
Some practical considerations for effective and efficient wafer-level reliability control. Microelectron. Reliab. 44 (8) (2004)
Summer F. C. Tseng, Wei-Ting Kary Chien, Bing-Chu Cai
Improvement of poly-silicon hole induced gate oxide failure by silicon rich oxidation. Microelectron. Reliab. 43 (5) (2003)
Summer Fan-Chung Tseng, Wei-Ting Kary Chien, Excimer Gong, Bing-Chu Cai
A cost-effective wafer-level reliability test system for integrated circuit makers. IEEE Trans. Instrum. Meas. 52 (5) (2003)