Wafer level package wafer probing shift error-proof quality control.
Morn JinWenwen HeJohn QiaoWei-Ting Kary ChienShirley ZhaoPublished in: IEEM (2015)
Keyphrases
- quality control
- manufacturing process
- semiconductor manufacturing
- machine vision
- quality assurance
- integrated circuit
- manufacturing systems
- massively parallel
- product quality
- levels of abstraction
- error rate
- automated visual inspection
- error analysis
- real time
- confidence levels
- quality improvement
- surface inspection
- process control
- reinforcement learning
- error detection
- product design
- higher level
- computer vision