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The investigation of semiconductor shipping bag reliability.
Hailin Jonson Gao
Xueliang Ruben Zhang
Yanju Lisa Yu
Kaiyuan Kevin Chang
Wei-Ting Kary Chien
Published in:
IEEM (2015)
Keyphrases
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bag of words
reliability analysis
genetic algorithm
single instance
visual features
real time
databases
neural network
case study
image classification
plasma etching
reliability assessment
software reliability
multi instance learning
multi label
supervised learning
artificial neural networks
data sets