Login / Signup
Seung Chul Song
Publication Activity (10 Years)
Years Active: 2011-2019
Publications (10 Years): 3
Top Topics
Nm Technology
Low Voltage
Random Access Memory
Power Consumption
Top Venues
IEEE Trans. Circuits Syst. I Regul. Pap.
IEEE Trans. Very Large Scale Integr. Syst.
Microelectron. Reliab.
IEEE J. Solid State Circuits
</>
Publications
</>
Hanwool Jeong
,
Juhyun Park
,
Seung Chul Song
,
Seong-Ook Jung
Self-Timed Pulsed Latch for Low-Voltage Operation With Reduced Hold Time.
IEEE J. Solid State Circuits
54 (8) (2019)
Hanwool Jeong
,
Tae Woo Oh
,
Seung Chul Song
,
Seong-Ook Jung
Sense-Amplifier-Based Flip-Flop With Transition Completion Detection for Low-Voltage Operation.
IEEE Trans. Very Large Scale Integr. Syst.
26 (4) (2018)
Younghwi Yang
,
Hanwool Jeong
,
Seung Chul Song
,
Joseph Wang
,
Geoffrey Yeap
,
Seong-Ook Jung
Single Bit-Line 7T SRAM Cell for Near-Threshold Voltage Operation With Enhanced Performance and Energy in 14 nm FinFET Technology.
IEEE Trans. Circuits Syst. I Regul. Pap.
(7) (2016)
Younghwi Yang
,
Juhyun Park
,
Seung Chul Song
,
Joseph Wang
,
Geoffrey Yeap
,
Seong-Ook Jung
Single-Ended 9T SRAM Cell for Near-Threshold Voltage Operation With Enhanced Read Performance in 22-nm FinFET Technology.
IEEE Trans. Very Large Scale Integr. Syst.
23 (11) (2015)
Younghwi Yang
,
Juhyun Park
,
Seung Chul Song
,
Joseph Wang
,
Geoffrey Yeap
,
Seong-Ook Jung
SRAM Design for 22-nm ETSOI Technology: Selective Cell Current Boosting and Asymmetric Back-Gate Write-Assist Circuit.
IEEE Trans. Circuits Syst. I Regul. Pap.
(6) (2015)
Jason Woo
,
P. Y. Chien
,
Frank Yang
,
Seung Chul Song
,
P. R. Chidi Chidambaram
,
Joseph Wang
,
Geoffrey Yeap
Improved device variability in scaled MOSFETs with deeply retrograde channel profile.
Microelectron. Reliab.
54 (6-7) (2014)
Seung Chul Song
,
M. Abu-Rahma
,
Geoffrey Yeap
FinFET based SRAM bitcell design for 32 nm node and below.
Microelectron. J.
42 (3) (2011)