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Improved device variability in scaled MOSFETs with deeply retrograde channel profile.
Jason Woo
P. Y. Chien
Frank Yang
Seung Chul Song
P. R. Chidi Chidambaram
Joseph Wang
Geoffrey Yeap
Published in:
Microelectron. Reliab. (2014)
Keyphrases
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improved algorithm
user profiles
multi channel
database
real time
case study