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Improved device variability in scaled MOSFETs with deeply retrograde channel profile.

Jason WooP. Y. ChienFrank YangSeung Chul SongP. R. Chidi ChidambaramJoseph WangGeoffrey Yeap
Published in: Microelectron. Reliab. (2014)
Keyphrases
  • improved algorithm
  • user profiles
  • multi channel
  • database
  • real time
  • case study