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N.-H. Lee
Publication Activity (10 Years)
Years Active: 2012-2023
Publications (10 Years): 3
Top Topics
News Stories
Latent Semantic Analysis
Process Management
High Speed
Top Venues
IRPS
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Publications
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Sungmock Ha
,
S. Lee
,
G. H. Bae
,
D. S. Lee
,
S. H. Kim
,
B. W. Woo
,
N.-H. Lee
,
Y. S. Lee
,
S. Pae
Reliability Characterization of HBM featuring $\text{HK}+\text{MG}$ Logic Chip with Multi-stacked DRAMs.
IRPS
(2023)
S. Lee
,
N.-H. Lee
,
K. W. Lee
,
J. H. Kim
,
J. H. Jin
,
Y. S. Lee
,
Y. C. Hwang
,
H. S. Kim
,
S. Pae
Development and Product Reliability Characterization of Advanced High Speed 14nm DDR5 DRAM with On-die ECC.
IRPS
(2023)
N.-H. Lee
,
S. Lee
,
S.-H. Kim
,
G.-J. Kim
,
K. W. Lee
,
Y. S. Lee
,
Y. C. Hwang
,
H. S. Kim
,
S. Pae
Transistor Reliability Characterization for Advanced DRAM with HK+MG & EUV process technology.
IRPS
(2022)
Seonhaeng Lee
,
Dongwoo Kim
,
Cheolgyu Kim
,
N.-H. Lee
,
Gang-Jun Kim
,
Chiho Lee
,
Jeongsoo Park
,
Bongkoo Kang
Effect of electron-electron scattering at an elevated temperature on device lifetime of nanoscale nMOSFETs.
Microelectron. Reliab.
52 (9-10) (2012)