Login / Signup
Jeongsoo Park
Publication Activity (10 Years)
Years Active: 2012-2012
Publications (10 Years): 0
Top Topics
Significantly Enhanced
High Density
Van Der Waals
Electrical Properties
Top Venues
Microelectron. Reliab.
</>
Publications
</>
Seonhaeng Lee
,
Dongwoo Kim
,
Cheolgyu Kim
,
Chiho Lee
,
Jeongsoo Park
,
Bongkoo Kang
Channel width dependence of mechanical stress effects induced by shallow trench isolation on device performance of nanoscale nMOSFETs.
Microelectron. Reliab.
52 (9-10) (2012)
Seonhaeng Lee
,
Dongwoo Kim
,
Cheolgyu Kim
,
N.-H. Lee
,
Gang-Jun Kim
,
Chiho Lee
,
Jeongsoo Park
,
Bongkoo Kang
Effect of electron-electron scattering at an elevated temperature on device lifetime of nanoscale nMOSFETs.
Microelectron. Reliab.
52 (9-10) (2012)
Dongwoo Kim
,
Seonhaeng Lee
,
Cheolgyu Kim
,
Chiho Lee
,
Jeongsoo Park
,
Bongkoo Kang
Enhanced degradation of n-MOSFETs with high-k/metal gate stacks under channel hot-carrier/gate-induced drain leakage alternating stress.
Microelectron. Reliab.
52 (9-10) (2012)