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Effect of electron-electron scattering at an elevated temperature on device lifetime of nanoscale nMOSFETs.

Seonhaeng LeeDongwoo KimCheolgyu KimN.-H. LeeGang-Jun KimChiho LeeJeongsoo ParkBongkoo Kang
Published in: Microelectron. Reliab. (2012)
Keyphrases
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