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Development and Product Reliability Characterization of Advanced High Speed 14nm DDR5 DRAM with On-die ECC.
S. Lee
N.-H. Lee
K. W. Lee
J. H. Kim
J. H. Jin
Y. S. Lee
Y. C. Hwang
H. S. Kim
S. Pae
Published in:
IRPS (2023)
Keyphrases
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high speed
case study
product design
product quality
life cycle
consumer products
design considerations
software engineering
information processing
main memory
development process
low power
error correction
high density
knowledge based systems
product development
multi dimensional
product line
information systems