Keno Sato

Publication Activity (10 Years)

Years Active: 2019-2024
Publications (10 Years): 18

Top Topics

Professional Practice

Fpga Implementation

Histogram Matching

Top Venues

Publications

Haruo Kobayashi, Naoki Tsukahara, Keno Sato, Takashi Oshima
Innovative Practices Session at VLSI Test Symposium 2024: Analog Testing Technologies for Digital Exploding Society. VTS (2024)
Keno Sato, Takayuki Nakatani, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Shogo Katayama, Daisuke Iimori, Misaki Takagi, Yujie Zhao, Shuhei Yamamoto, Anna Kuwana, Kentaroh Katoh, Kazumi Hatayama, Haruo Kobayashi
Low Distortion Sinusoidal Signal Generator with Harmonics Cancellation Using Two Types of Digital Predistortion. ITC (2023)
Shogo Katayama, Takayuki Nakatani, Daisuke Iimori, Misaki Takagi, Yujie Zhao, Anna Kuwana, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Kentaroh Katoh, Kazumi Hatayama, Haruo Kobayashi
Low distortion sine wave generator with simple harmonics cancellation circuit and filter for analog device testing. IEICE Electron. Express 20 (1) (2023)
Kentaroh Katoh, Shuhei Yamamoto, Zheming Zhao, Yujie Zhao, Shogo Katayama, Anna Kuwana, Takayuki Nakatani, Kazumi Hatayama, Haruo Kobayashi, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa
A Physically Unclonable Function Using Time-to-Digital Converter with Linearity Self-Calibration and its FPGA Implementation. ITC-Asia (2023)
Keno Sato, Takayuki Nakatani, Shogo Katayama, Daisuke Iimori, Gaku Ogihara, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Yujie Zhao, Kentaroh Katoh, Anna Kuwana, Kazumi Hatayama, Haruo Kobayashi
High Precision Voltage Measurement System Utilizing Low-End ATE Resource and BOST. ATS (2022)
Chris Mangelsdorf, Manasa Madhvaraj, Salvador Mir, Manuel Barragán, Daisuke Iimori, Takayuki Nakatani, Shogo Katayama, Gaku Ogihara, Yujie Zhao, Jianglin Wei, Anna Kuwana, Kentaroh Katoh, Kazumi Hatayama, Haruo Kobayashi, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa
Innovative Practices Track: Innovative Analog Circuit Testing Technologies. VTS (2022)
Yujie Zhao, Kentaroh Katoh, Anna Kuwana, Shogo Katayama, Jianglin Wei, Haruo Kobayashi, Takayuki Nakatani, Kazumi Hatayama, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa
Revisit to Histogram Method for ADC Linearity Test: Examination of Input Signal and Ratio of Input and Sampling Frequencies. J. Electron. Test. 38 (1) (2022)
Keno Sato, Takayuki Nakatani, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Shogo Katayama, Gaku Ogihara, Daisuke Iimori, Yujie Zhao, Jianglin Wei, Anna Kuwana, Kazumi Hatayama, Haruo Kobayashi
High Precision Measurement of Sub-Nano Ampere Current in ATE Environment. ATS (2021)
Daisuke Iimori, Takayuki Nakatani, Shogo Katayama, Gaku Ogihara, Akemi Hatta, Anna Kuwana, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Jianglin Wei, Yujie Zhao, Minh Tri Tran, Kazumi Hatayama, Haruo Kobayashi
Summing Node and False Summing Node Methods: Accurate Operational Amplifier AC Characteristics Testing without Audio Analyzer. ITC (2021)
Shuhei Yamamoto, Yuto Sasaki, Yujie Zhao, Jianglin Wei, Anna Kuwana, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Takayuki Nakatani, Minh Tri Tran, Shogo Katayama, Kazumi Hatayama, Haruo Kobayashi
Metallic Ratio Equivalent-Time Sampling: A Highly Efficient Waveform Acquisition Method. IOLTS (2021)
Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Jianglin Wei, Takayuki Nakatani, Yujie Zhao, Shogo Katayama, Shuhei Yamamoto, Anna Kuwana, Kazumi Hatayama, Haruo Kobayashi
Revisit to Accurate ADC Testing with Incoherent Sampling Using Proper Sinusoidal Signal and Sampling Frequencies. ITC (2021)
Gaku Ogihara, Takayuki Nakatani, Daisuke Iimori, Shogo Katayama, Anna Kuwana, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Yujie Zhao, Jianglin Wei, Kazumi Hatayama, Haruo Kobayashi
Evaluation of High-Precision Nano-Ampere Current Measurement Method for Mass Production. ICECS (2021)
Gaku Ogihara, Takayuki Nakatani, Akemi Hatta, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Anna Kuwana, Riho Aoki, Shogo Katayama, Jianglin Wei, Yujie Zhao, Jianlong Wang, Kazumi Hatayama, Haruo Kobayashi
Summing Node Test Method: Simultaneous Multiple AC Characteristics Testing of Multiple Operational Amplifiers. ATS (2020)
Keno Sato, Takayuki Nakatani, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Anna Kuwana, Kazumi Hatayama, Haruo Kobayashi
Accurate Testing of Precision Voltage Reference by DC-AC Conversion. ATS (2020)
Yusuke Asada, Takahiko Shimizu, Yuji Gendai, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Jiang-Lin Wei, Nene Kushita, Hirotaka Arai, Anna Kuwana, Takayuki Nakatani, Kazumi Hatayama, Haruo Kobayashi
Innovative Test Practices in Japan. VTS (2019)
Riho Aoki, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Shogo Katayama, Yuto Sasaki, Kosuke Machida, Takayuki Nakatani, Jianlong Wang, Anna Kuwana, Kazumi Hatayama, Haruo Kobayashi
Evaluation of Null Method for Operational Amplifier Short-Time Testing. ASICON (2019)
Jiang-Lin Wei, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Nene Kushita, Takahiro Arai, Lei Sha, Anna Kuwana, Haruo Kobayashi, Takayuki Nakatani, Kazumi Hatayama, Keno Sato
High-Resolution Low-Sampling-Rate Δ∑ ADC Linearity Short-Time Testing Algorithm. ASICON (2019)
Yuto Sasaki, Kosuke Machida, Riho Aoki, Shogo Katayama, Takayuki Nakatani, Jianlong Wang, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Anna Kuwana, Kazumi Hatayama, Haruo Kobayashi
Accurate and Fast Testing Technique of Operational Amplifier DC Offset Voltage in µV-Order by DC-AC Conversion. ITC-Asia (2019)