High-Resolution Low-Sampling-Rate Δ∑ ADC Linearity Short-Time Testing Algorithm.
Jiang-Lin WeiTakashi IshidaToshiyuki OkamotoTamotsu IchikawaNene KushitaTakahiro AraiLei ShaAnna KuwanaHaruo KobayashiTakayuki NakataniKazumi HatayamaKeno SatoPublished in: ASICON (2019)
Keyphrases
- sampling rate
- dynamic programming
- experimental evaluation
- k means
- times faster
- objective function
- high accuracy
- cost function
- learning algorithm
- detection algorithm
- optimization algorithm
- worst case
- convergence rate
- significant improvement
- preprocessing
- computational cost
- recognition algorithm
- high resolution
- three dimensional
- test cases
- high resolution images
- probabilistic model
- single image
- image quality
- wavelet transform
- np hard
- optimal solution
- feature selection