Revisit to Histogram Method for ADC Linearity Test: Examination of Input Signal and Ratio of Input and Sampling Frequencies.
Yujie ZhaoKentaroh KatohAnna KuwanaShogo KatayamaJianglin WeiHaruo KobayashiTakayuki NakataniKazumi HatayamaKeno SatoTakashi IshidaToshiyuki OkamotoTamotsu IchikawaPublished in: J. Electron. Test. (2022)