Takashi Ishida

Publication Activity (10 Years)

Years Active: 2022-2023
Publications (10 Years): 6

Top Topics

Data Conversion

Top Venues

J. Electron. Test.

Publications

Keno Sato, Takayuki Nakatani, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Shogo Katayama, Daisuke Iimori, Misaki Takagi, Yujie Zhao, Shuhei Yamamoto, Anna Kuwana, Kentaroh Katoh, Kazumi Hatayama, Haruo Kobayashi
Low Distortion Sinusoidal Signal Generator with Harmonics Cancellation Using Two Types of Digital Predistortion. ITC (2023)
Shogo Katayama, Takayuki Nakatani, Daisuke Iimori, Misaki Takagi, Yujie Zhao, Anna Kuwana, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Kentaroh Katoh, Kazumi Hatayama, Haruo Kobayashi
Low distortion sine wave generator with simple harmonics cancellation circuit and filter for analog device testing. IEICE Electron. Express 20 (1) (2023)
Kentaroh Katoh, Shuhei Yamamoto, Zheming Zhao, Yujie Zhao, Shogo Katayama, Anna Kuwana, Takayuki Nakatani, Kazumi Hatayama, Haruo Kobayashi, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa
A Physically Unclonable Function Using Time-to-Digital Converter with Linearity Self-Calibration and its FPGA Implementation. ITC-Asia (2023)
Keno Sato, Takayuki Nakatani, Shogo Katayama, Daisuke Iimori, Gaku Ogihara, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Yujie Zhao, Kentaroh Katoh, Anna Kuwana, Kazumi Hatayama, Haruo Kobayashi
High Precision Voltage Measurement System Utilizing Low-End ATE Resource and BOST. ATS (2022)
Chris Mangelsdorf, Manasa Madhvaraj, Salvador Mir, Manuel Barragán, Daisuke Iimori, Takayuki Nakatani, Shogo Katayama, Gaku Ogihara, Yujie Zhao, Jianglin Wei, Anna Kuwana, Kentaroh Katoh, Kazumi Hatayama, Haruo Kobayashi, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa
Innovative Practices Track: Innovative Analog Circuit Testing Technologies. VTS (2022)
Yujie Zhao, Kentaroh Katoh, Anna Kuwana, Shogo Katayama, Jianglin Wei, Haruo Kobayashi, Takayuki Nakatani, Kazumi Hatayama, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa
Revisit to Histogram Method for ADC Linearity Test: Examination of Input Signal and Ratio of Input and Sampling Frequencies. J. Electron. Test. 38 (1) (2022)