Accurate and Fast Testing Technique of Operational Amplifier DC Offset Voltage in µV-Order by DC-AC Conversion.
Yuto SasakiKosuke MachidaRiho AokiShogo KatayamaTakayuki NakataniJianlong WangKeno SatoTakashi IshidaToshiyuki OkamotoTamotsu IchikawaAnna KuwanaKazumi HatayamaHaruo KobayashiPublished in: ITC-Asia (2019)