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Evaluation of Null Method for Operational Amplifier Short-Time Testing.

Riho AokiKeno SatoTakashi IshidaToshiyuki OkamotoTamotsu IchikawaShogo KatayamaYuto SasakiKosuke MachidaTakayuki NakataniJianlong WangAnna KuwanaKazumi HatayamaHaruo Kobayashi
Published in: ASICON (2019)
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