Jim Thorpe

Publication Activity (10 Years)

Years Active: 1988-2012
Publications (10 Years): 0

Top Topics

Electrical Properties

Leakage Current

Silicon Dioxide

Top Venues

Microelectron. Reliab.

Publications

Benoit Lambert, Nathalie Labat, Dominique Carisetti, Serge Karboyan, Jean-Guy Tartarin, Jim Thorpe, Laurent Brunel, Arnaud Curutchet, Nathalie Malbert, Eddy Latu-Romain, Michel Mermoux
Evidence of relationship between mechanical stress and leakage current in AlGaN/GaN transistor after storage test. Microelectron. Reliab. 52 (9-10) (2012)
Benoit Lambert, Jim Thorpe, Reza Behtash, Bernd Schauwecker, Franck Bourgeois, Helmut Jung, Joëlle Bataille, Patrick Mezenge, Cyril Gourdon, Catherine Ollivier, Didier Floriot, Hervé Blanck
Reliability data's of 0.5 μm AlGaN/GaN on SiC technology qualification. Microelectron. Reliab. 52 (9-10) (2012)
Jim Thorpe
Innovative Design and the Language of Struggle. AI Soc. 9 (2) (1995)
Jim Thorpe
Reflections in a Muddy Puddle. AI Soc. 2 (1) (1988)