Dominique Carisetti

Publication Activity (10 Years)

Years Active: 2009-2012
Publications (10 Years): 0

Top Topics

Video Sequences

Electrical Properties

Leakage Current

Silicon Dioxide

Top Venues

Microelectron. Reliab.

Publications

Benoit Lambert, Nathalie Labat, Dominique Carisetti, Serge Karboyan, Jean-Guy Tartarin, Jim Thorpe, Laurent Brunel, Arnaud Curutchet, Nathalie Malbert, Eddy Latu-Romain, Michel Mermoux
Evidence of relationship between mechanical stress and leakage current in AlGaN/GaN transistor after storage test. Microelectron. Reliab. 52 (9-10) (2012)
Michele Piazza, Christian Dua, Mourad Oualli, Erwan Morvan, Dominique Carisetti, Frédéric Wyczisk
Degradation of TiAlNiAu as ohmic contact metal for GaN HEMTs. Microelectron. Reliab. 49 (9-11) (2009)