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Degradation of TiAlNiAu as ohmic contact metal for GaN HEMTs.

Michele PiazzaChristian DuaMourad OualliErwan MorvanDominique CarisettiFrédéric Wyczisk
Published in: Microelectron. Reliab. (2009)
Keyphrases
  • electric field
  • structuring elements
  • three dimensional
  • decision making
  • face recognition
  • pattern recognition
  • medical images
  • gray scale
  • image degradation
  • high temperature