Jaap M. J. den Toonder

Publication Activity (10 Years)

Years Active: 2004-2023
Publications (10 Years): 5

Top Topics

Autonomous Learning

Top Venues

IEEE Trans. Robotics

IEEE Trans Autom. Sci. Eng.

Publications

Sevda Malek Kani, Ruben J. H. Marteijn, Eduard Pelssers, Jaap M. J. den Toonder
Wearable sweat sensing device determining sweat rate per gland. MeMeA (2023)
Xiaoyu Yin, Elisabetta Peri, Eduard Pelssers, Jaap M. J. den Toonder, Massimo Mischi
Estimation of blood glucose levels by sweat sensing based on biophysical modeling of glucose transport. MeMeA (2023)
Livio D'Alvia, Eduard Pelssers, Emma J. M. Moonen, Zaccaria Del Prete, Ludovica Apa, Jaap M. J. den Toonder
Skin safety test in electrowetting application: a preliminary study. MeMeA (2023)
James M. Muganda, Bas Jansen, Erik Homburg, Yoeri van de Burgt, Jaap M. J. den Toonder
Influence Function Measurement Technique Using the Direct and Indirect Piezoelectric Effect for Surface Shape Control in Adaptive Systems. IEEE Trans Autom. Sci. Eng. 19 (2) (2022)
Meiyi Zhou, Peiran Chen, Andreas M. A. O. Pollet, Sotir Ouzounov, Simona Turco, Jaap M. J. den Toonder, Massimo Mischi, Eugenio Cantatore, Pieter Harpe
The Impact of the AFE BPF in Ultrasound Harmonic Imaging: An In-Vitro Phantom Study. BioCAS (2021)
Gari Arutinov, Massimo Mastrangeli, Gert van Heck, Pierre Lambert, Jaap M. J. den Toonder, Andreas Dietzel, Edsger C. P. Smits
Capillary Gripping and Self-Alignment: A Route Toward Autonomous Heterogeneous Assembly. IEEE Trans. Robotics 31 (4) (2015)
Gari Arutinov, Massimo Mastrangeli, Edsger C. P. Smits, Gert van Heck, Herman F. M. Schoo, Jaap M. J. den Toonder, Andreas Dietzel
Shift Dynamics of Capillary Self-Alignment. IPAS (2014)
Tae Gon Kang, Martien A. Hulsen, Jaap M. J. den Toonder, Patrick D. Anderson, Han E. H. Meijer
A direct simulation method for flows with suspended paramagnetic particles. J. Comput. Phys. 227 (9) (2008)
Viktor Gonda, Kaspar M. B. Jansen, Leo J. Ernst, Jaap M. J. den Toonder, G. Q. Zhang
Micro-mechanical testing of SiLK by nanoindentation and substrate curvature techniques. Microelectron. Reliab. 47 (2-3) (2007)
Robert Modlinski, Ann Witvrouw, Petar Ratchev, A. Jourdain, Veerle Simons, H. A. C. Tilmans, Jaap M. J. den Toonder, Robert Puers, Ingrid De Wolf
Creep as a reliability problem in MEMS. Microelectron. Reliab. 44 (9-11) (2004)
Viktor Gonda, Jaap M. J. den Toonder, Johan Beijer, G. Q. Zhang, Willem D. van Driel, Romano J. O. M. Hoofman, Leo J. Ernst
Prediction of thermo-mechanical integrity of wafer backend processes. Microelectron. Reliab. 44 (12) (2004)