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Creep as a reliability problem in MEMS.
Robert Modlinski
Ann Witvrouw
Petar Ratchev
A. Jourdain
Veerle Simons
H. A. C. Tilmans
Jaap M. J. den Toonder
Robert Puers
Ingrid De Wolf
Published in:
Microelectron. Reliab. (2004)
Keyphrases
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reliability analysis
reliability assessment
pattern recognition
real world
information retrieval
learning algorithm
search engine
computer vision
error detection
software reliability