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Creep as a reliability problem in MEMS.

Robert ModlinskiAnn WitvrouwPetar RatchevA. JourdainVeerle SimonsH. A. C. TilmansJaap M. J. den ToonderRobert PuersIngrid De Wolf
Published in: Microelectron. Reliab. (2004)
Keyphrases
  • reliability analysis
  • reliability assessment
  • pattern recognition
  • real world
  • information retrieval
  • learning algorithm
  • search engine
  • computer vision
  • error detection
  • software reliability