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Fahim ur Rahman
ORCID
Publication Activity (10 Years)
Years Active: 2018-2020
Publications (10 Years): 8
Top Topics
Cmos Technology
Bias Correction
Metal Oxide Semiconductor
Total Energy
Top Venues
IEEE J. Solid State Circuits
ISSCC
VLSI Circuits
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Publications
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Fahim ur Rahman
,
Rajesh Pamula
,
Visvesh S. Sathe
Computationally Enabled Minimum Total Energy Tracking for a Performance Regulated Sub-Threshold Microprocessor in 65-nm CMOS.
IEEE J. Solid State Circuits
55 (2) (2020)
Fahim ur Rahman
,
Sung Kim
,
Naveen John
,
Roshan Kumar
,
Xi Li
,
Rajesh Pamula
,
Keith A. Bowman
,
Visvesh S. Sathe
A Unified Clock and Switched-Capacitor-Based Power Delivery Architecture for Variation Tolerance in Low-Voltage SoC Domains.
IEEE J. Solid State Circuits
54 (4) (2019)
Fahim ur Rahman
,
Greg Taylor
,
Visvesh Sathe
A 1-2 GHz Computational-Locking ADPLL With Sub-20-Cycle Locktime Across PVT Variation.
IEEE J. Solid State Circuits
54 (9) (2019)
Fahim ur Rahman
,
Rajesh Pamula
,
Akshat Boora
,
Xun Sun
,
Visvesh Sathe
Computationally Enabled Total Energy Minimization Under Performance Requirements for a Voltage-Regulated 0.38-to-0.58V Microprocessor in 65nm CMOS.
ISSCC
(2019)
Xun Sun
,
Fahim ur Rahman
,
Venkata Rajesh Pamula
,
Sung Kim
,
Xi Li
,
Naveen John
,
Visvesh S. Sathe
-Margin Reduction in a 0.6-to-1.0-V Cortex-M0 Processor.
IEEE J. Solid State Circuits
54 (11) (2019)
Xun Sun
,
Sung Kim
,
Fahim ur Rahman
,
Venkata Rajesh Pamula
,
Xi Li
,
Naveen John
,
Visvesh S. Sathe
A combined all-digital PLL-buck slack regulation system with autonomous CCM/DCM transition control and 82% average voltage-margin reduction in a 0.6-to-1.0V cortex-M0 processor.
ISSCC
(2018)
Fahim ur Rahman
,
Sung Kim
,
Naveen John
,
Roshan Kumar
,
Xi Li
,
Rajesh Pamula
,
Keith A. Bowman
,
Visvesh S. Sathe
An All-Digital Unified Clock Frequency and Switched-Capacitor Voltage Regulator for Variation Tolerance in a Sub-Threshold ARM Cortex M0 Processor.
VLSI Circuits
(2018)
Rajesh Pamula
,
Xun Sun
,
Sung Kim
,
Fahim ur Rahman
,
Baosen Zhang
,
Visvesh S. Sathe
An All-Digital True-Random-Number Generator with Integrated De-correlation and Bias Correction at 3.2-to-86 MB/S, 2.58 PJ/Bit in 65-NM CMOS.
VLSI Circuits
(2018)