LANE DETECTION
Experts
- Fei-Yue Wang
- Nanning Zheng
- Josef Kittler
- Reinhard Klette
- Mohan M. Trivedi
- Dongpu Cao
- Alberto Broggi
- Markos Papageorgiou
- Saïd Mammar
- Long Chen
- Chunzhao Guo
- Miguel Ángel Sotelo
- Christoph Stiller
- Li Li
- Mark B. Sandler
- Luc Van Gool
- Ioannis Papamichail
- Son Lam Phung
- Abdesselam Bouzerdoum
- Mark S. Nixon
- Bing-Fei Wu
- Junmin Wang
- Fawzi Nashashibi
- Chung Choo Chung
- Yang Li
- Seiichi Mita
- Seung-Hi Lee
- Xiangjing An
- Kazuhito Murakami
- John Illingworth
- Ricardo Reghelin
- Sebastien Glaser
- Petros A. Ioannou
- Siyu Teng
- Christian Laugier
- Dan Levi
- Zhanyi Hu
- Alessandro Corrêa Victorino
- Alois C. Knoll
Venues
- CoRR
- ITSC
- IEEE Trans. Intell. Transp. Syst.
- Intelligent Vehicles Symposium
- Sensors
- IEEE Access
- IEEE Trans. Intell. Veh.
- IV
- Pattern Recognit. Lett.
- IEEE Trans. Veh. Technol.
- IROS
- Pattern Recognit.
- ICRA
- ACC
- ICASSP
- ICPR
- IEEE Intell. Transp. Syst. Mag.
- IEEE Trans. Pattern Anal. Mach. Intell.
- Image Vis. Comput.
- ICIP
- SMC
- MVA
- VEHITS
- ICCV
- ICARCV
- CVPR
- Multim. Tools Appl.
- VTC Fall
- ICVES
- ECC
- ICCVE
- Mach. Vis. Appl.
- J. Intell. Transp. Syst.
- SIU
- Expert Syst. Appl.
- VTC Spring
- IEEE Trans. Ind. Electron.
- CDC
- Comput. Vis. Image Underst.
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