EXTERNAL DISTURBANCES
Experts
- Shaocheng Tong
- Yongming Li
- Yuri B. Shtessel
- Mou Chen
- Shuzhi Sam Ge
- Yongchun Fang
- Xinjiang Wei
- Dongkyoung Chwa
- Guang-Hong Yang
- Warren E. Dixon
- Huaguang Zhang
- Shihua Li
- Giorgio Bartolini
- Changyin Sun
- Harald Aschemann
- Ligang Wu
- Xinghuo Yu
- Huifeng Zhang
- Peng Shi
- Leonid M. Fridman
- Carlos Silvestre
- Gang Tao
- Bijnan Bandyopadhyay
- Tingwen Huang
- Xinping Guan
- Gang Feng
- Liu Hsu
- Jianguo Guo
- Marek Jaskula
- Jianxing Liu
- Jianqiang Yi
- Choon Ki Ahn
- Tiago Roux Oliveira
- Antonella Ferrara
- Bin Jiang
- Tieshan Li
- Jun Zhou
- Laxmidhar Behera
- C. L. Philip Chen
Venues
- IEEE Access
- ACC
- CDC
- CoRR
- J. Frankl. Inst.
- IEEE Trans. Ind. Electron.
- Autom.
- Trans. Inst. Meas. Control
- IEEE Trans. Autom. Control.
- IECON
- Int. J. Syst. Sci.
- IEEE Trans. Fuzzy Syst.
- ICRA
- Neurocomputing
- Int. J. Control
- IEEE Trans. Control. Syst. Technol.
- ECC
- IEEE Trans. Cybern.
- IEEE Trans. Syst. Man Cybern. Syst.
- IROS
- J. Syst. Control. Eng.
- Complex.
- Sci. China Inf. Sci.
- Inf. Sci.
- VSS
- Eur. J. Control
- Sensors
- Appl. Math. Comput.
- IEEE Trans. Aerosp. Electron. Syst.
- CCA
- ICCA
- IEEE Trans. Circuits Syst. II Express Briefs
- ASCC
- SMC
- FUZZ-IEEE
- Int. J. Model. Identif. Control.
- Syst. Control. Lett.
- ROBIO
- IEEE Trans. Veh. Technol.
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