EXPERIMENTAL VERIFICATION
Experts
- Naoki Uchiyama
- Shigenori Sano
- Masami Iwase
- Masaru Uchiyama
- Stéphane Donnay
- Alenka G. Zajic
- George Nikolakopoulos
- Ahmed S. Elwakil
- Gordon L. Stüber
- Ryo Takahashi
- Kenichiro Nonaka
- Xiaofei Li
- Marc van Heijningen
- Georges G. E. Gielen
- Yushi Shirato
- Luis T. Aguilar
- Anthony Tzes
- Yong Li
- Mustafa Badaroglu
- Koichi Osuka
- Son Nguyen
- Nikhil Chopra
- Kazuma Sekiguchi
- Kostas Alexis
- Bo Dong
- Krzysztof Kozlowski
- Yunong Zhang
- Eric Rogers
- Thomas G. Pratt
- Yury Orlov
- Kazuki Maruta
- Yizhar Or
- Kazuo Tsuchiya
- Atsushi Ohta
- Takashi Hikihara
- Shin-ichi Hamasaki
- Shinya Aoi
- Masayuki Fujita
- Georgia Tsirimokou
Venues
- IEEE Access
- Sensors
- CoRR
- ACC
- IECON
- IEEE Trans. Ind. Electron.
- ICRA
- IROS
- J. Robotics Mechatronics
- IEEE Trans. Instrum. Meas.
- SII
- IEEE Trans. Control. Syst. Technol.
- Robotica
- IEEE Trans. Circuits Syst. I Regul. Pap.
- VTC Fall
- IEICE Trans. Electron.
- OFC
- AIM
- CDC
- ISIE
- ICIT
- IEICE Trans. Commun.
- ROBIO
- Int. J. Bifurc. Chaos
- J. Circuits Syst. Comput.
- ISCAS
- Adv. Robotics
- ISER
- ECOC
- EMBC
- Microelectron. Reliab.
- IAS
- J. Symb. Log.
- Symmetry
- IEEE Robotics Autom. Lett.
- VTC Spring
- IEEE J. Solid State Circuits
- AMC
- Int. J. Circuit Theory Appl.
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