EXPERIMENTAL VERIFICATION
Experts
- Naoki Uchiyama
- Masami Iwase
- Shigenori Sano
- Stéphane Donnay
- George Nikolakopoulos
- Ahmed S. Elwakil
- Masaru Uchiyama
- Alenka G. Zajic
- Shin-ichi Hamasaki
- Thomas G. Pratt
- Yunong Zhang
- Bo Dong
- Yushi Shirato
- Krzysztof Kozlowski
- Eric Rogers
- Yong Li
- Shinya Aoi
- Georges G. E. Gielen
- Kazuo Tsuchiya
- Hugo J. De Man
- Yizhar Or
- Anthony Tzes
- Gordon L. Stüber
- Kenichiro Nonaka
- Marc van Heijningen
- Atsushi Ohta
- Takashi Hikihara
- Nikhil Chopra
- Mustafa Badaroglu
- Kazuma Sekiguchi
- Koichi Osuka
- Ryo Takahashi
- Kostas Alexis
- Luis T. Aguilar
- Georgia Tsirimokou
- Yury Orlov
- Kazuki Maruta
- Costas Psychalinos
- Masayuki Fujita
Venues
- IEEE Access
- Sensors
- CoRR
- ACC
- IECON
- IEEE Trans. Ind. Electron.
- ICRA
- IROS
- J. Robotics Mechatronics
- IEEE Trans. Instrum. Meas.
- SII
- IEEE Trans. Control. Syst. Technol.
- Robotica
- OFC
- IEEE Trans. Circuits Syst. I Regul. Pap.
- IEICE Trans. Electron.
- AIM
- CDC
- VTC Fall
- Int. J. Bifurc. Chaos
- ICIT
- ROBIO
- IEICE Trans. Commun.
- J. Circuits Syst. Comput.
- ISIE
- EMBC
- Microelectron. Reliab.
- Symmetry
- Adv. Robotics
- J. Symb. Log.
- ECOC
- IEEE Robotics Autom. Lett.
- ISCAS
- ISER
- IAS
- IEEE J. Solid State Circuits
- VTC Spring
- AMC
- Int. J. Circuit Theory Appl.
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