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Detecting and Scoring Equipment Faults in Real Time During Semiconductor Test Processes.
Yi-Hsin Wu
Jui-Yu Huang
Yi-Chun Yao
Yin-Jing Tien
Cheng-Juei Yu
Sheng-De Wang
Published in:
IEEE Des. Test (2021)
Keyphrases
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real time
test cases
automatic detection
low cost
built in self test
mutation testing
fault diagnosis
high speed
control system
test suite
test generation
test sequences
fuzzy logic
software systems
information technology
video sequences
fault detection
real time systems
decision making
database