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Cost-Effective Generation of Minimal Test Sets for Stuck-at Faults in Combinational Logic Circuits.
Seiji Kajihara
Irith Pomeranz
Kozo Kinoshita
Sudhakar M. Reddy
Published in:
DAC (1993)
Keyphrases
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cost effective
logic circuits
test set
low power
low cost
test cases
error rate
training set
functional decomposition
gate array
test data
cost effectiveness
fault diagnosis
training data
tunnel diode
high speed
logic synthesis
training and test sets
power consumption
data sets
random selection
feature extraction