Testing LCD Source Driver IC with Built-on-Scribe-Line Test Circuitry.
Jui-Jer HuangChiuan-Che LiJiun-Lang HuangPublished in: ATS (2008)
Keyphrases
- test cases
- software testing
- test data
- test case generation
- test generation
- test suite
- model based testing
- regression testing
- test sequences
- multiple sources
- integrated circuit
- code coverage
- liquid crystal displays
- statistical tests
- information systems
- data sets
- line drawings
- high resolution
- testing process
- multiresolution
- image sequences
- image processing