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Test Generation for Transistor Shorts using Stuck-at Fault Simulator and Test Generator.
Yoshinobu Higami
Kewal K. Saluja
Hiroshi Takahashi
Shin-ya Kobayashi
Yuzo Takamatsu
Published in:
ATS (2007)
Keyphrases
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test generation
test cases
test sequences
software testing
design automation
symbolic execution
mutation testing
static analysis
quality assurance
high speed
code coverage
fault diagnosis
test data generation
integrated circuit
fault detection
test suite
software systems
image data
decision trees
database