Test generation and fault detection for VLSI PPL circuits.
Alaaeldin A. M. AminKent F. SmithPublished in: Integr. (1989)
Keyphrases
- fault detection
- test generation
- vlsi circuits
- chip design
- high speed
- power dissipation
- test cases
- fault diagnosis
- fault identification
- condition monitoring
- industrial processes
- design automation
- static analysis
- quality assurance
- failure detection
- fault detection and diagnosis
- robust fault detection
- fuel cell
- software testing
- circuit design
- neural network
- tennessee eastman
- real time
- fault localization
- power consumption
- expert systems
- power plant