On System-on-Chip Testing Using Hybrid Test Vector Compression.
Satyendra N. BiswasSunil R. DasEmil M. PetriuPublished in: IEEE Trans. Instrum. Meas. (2014)
Keyphrases
- test cases
- test data
- software testing
- test generation
- test sequences
- statistical tests
- feature vectors
- test suite
- image compression
- test case generation
- integration testing
- code coverage
- compression ratio
- data compression
- regression testing
- testing process
- model based testing
- compression algorithm
- software systems
- test set
- neural network
- sparse matrix