Generating Compact Test Patterns for Stuck-at Faults and Transition Faults in One ATPG Run.

Yi-Cheng Kung Kuen-Jong Lee Sudhakar M. Reddy

Published in: ITC-Asia (2018)

Keyphrases

test cases
fault diagnosis
built in self test
fault detection
root cause
fault detection and diagnosis
model based diagnosis
fault model
integrated circuit
data sets
neural network
multiple faults
learning algorithm
design patterns
software testing
fault detection and isolation