Recovering Sequential Circuits from Temporary Faults: The Survival Capability of Scan-Cells.

Jose Miguel Vieira dos Santos

Published in: IOLTW (2002)

Keyphrases

built in self test
fault diagnosis
fault models
circuit design
high speed
scan data
analog circuits
fault detection
digital circuits
error detection
fault detection and isolation
fault model
asynchronous circuits
real time
visual cortex
model based diagnosis
test cases
low cost
genetic algorithm
neural network