Selecting Close-to-Functional Path Delay Faults for Test Generation.
Irith PomeranzPublished in: ITC (2020)
Keyphrases
- test generation
- test cases
- mutation testing
- test sequences
- symbolic execution
- design automation
- path length
- shortest path
- software testing
- fault diagnosis
- quality assurance
- static analysis
- destination node
- neural network
- code coverage
- fault detection
- databases
- wireless sensor networks
- image processing
- test set
- real world
- test data generation
- learning algorithm
- regression testing
- machine learning
- computer vision
- software development
- data sets
- error rate