Multi-Resolution and Noise-Resistant Surface Defect Detection Approach Using New Version of Local Binary Patterns.
Shervan Fekri ErshadFarshad TajeripourPublished in: Appl. Artif. Intell. (2017)
Keyphrases
- local binary pattern
- defect detection
- noise resistant
- multiresolution
- texture analysis
- feature extraction
- textured surfaces
- texture classification
- image texture
- scale invariant
- texture information
- face recognition
- multiscale
- illumination invariant
- facial expression recognition
- rotation invariant
- texture descriptors
- spatial information
- texture features
- three dimensional
- automated visual inspection
- feature descriptors
- face detection
- scale and rotation invariant
- background subtraction
- geometric moments
- texture images
- feature vectors
- gabor filters
- d objects
- gray level
- classification accuracy
- image matching
- feature space
- surface meshes
- preprocessing
- particle filter