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Experts
- Matti Pietikäinen
- Shiguang Shan
- Guoying Zhao
- Xilin Chen
- Wen Gao
- David Zhang
- Stan Z. Li
- Weihong Deng
- Odemir Martinez Bruno
- Abdenour Hadid
- Rama Chellappa
- Qiuqi Ruan
- Anil K. Jain
- Zhen Lei
- Yunhong Wang
- Tieniu Tan
- Liming Chen
- Xiaoou Tang
- Jian Yang
- André Ricardo Backes
- Lei Zhang
- Li Liu
- Yong Man Ro
- Richa Singh
- Mayank Vatsa
- Thomas S. Huang
- Wanquan Liu
- João Batista Florindo
- Ahmed Bouridane
- Dacheng Tao
- Stefano Berretti
- Kevin W. Bowyer
- Marios Savvides
- Loris Nanni
- Nasser M. Nasrabadi
- Shangfei Wang
- Ran He
- Paul W. Fieguth
- Jun Wang
Venues
- CoRR
- ICIP
- Multim. Tools Appl.
- Pattern Recognit.
- ICPR
- Pattern Recognit. Lett.
- IEEE Access
- Neurocomputing
- ICASSP
- IEEE Trans. Image Process.
- CVPR
- FG
- Sensors
- CVPR Workshops
- IGARSS
- Expert Syst. Appl.
- IEEE Trans. Pattern Anal. Mach. Intell.
- IJCNN
- ICCV
- J. Electronic Imaging
- Image Vis. Comput.
- BMVC
- SMC
- IET Image Process.
- Int. J. Pattern Recognit. Artif. Intell.
- Remote. Sens.
- CCBR
- J. Vis. Commun. Image Represent.
- SIU
- IEICE Trans. Inf. Syst.
- EUSIPCO
- ICB
- ISBI
- ICME
- Comput. Vis. Image Underst.
- Signal Image Video Process.
- IEEE Signal Process. Lett.
- Vis. Comput.
- Inf. Sci.
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