TEXTURE DESCRIPTORS
Experts
- Matti Pietikäinen
- Odemir Martinez Bruno
- André Ricardo Backes
- Guoying Zhao
- João Batista Florindo
- Loris Nanni
- Odemir M. Bruno
- Paul W. Fieguth
- Abdenour Hadid
- Nicolas Vandenbroucke
- Sheryl Brahnam
- Francesco Bianconi
- Alice Porebski
- Yongsheng Dong
- Tieniu Tan
- Li Liu
- Shervan Fekri Ershad
- Wesley Nunes Gonçalves
- Alessandra Lumini
- Antonio Fernández
- Lucas Correia Ribas
- Yilmaz Kaya
- Ludovic Macaire
- Andreas Uhl
- Niraj P. Doshi
- Gerald Schaefer
- Paul F. Whelan
- Rangaraj M. Rangayyan
- Liming Chen
- Yassine Ruichek
- Paolo Napoletano
- Yong Xu
- Leonardo F. S. Scabini
- Topi Mäenpää
- Jarbas Joaci de Mesquita Sá Junior
- Shekhar Karanwal
- Dmitry Chetverikov
- Timo Ojala
- Naoufel Werghi
Venues
- CoRR
- ICIP
- Pattern Recognit.
- Multim. Tools Appl.
- ICPR
- Pattern Recognit. Lett.
- IEEE Trans. Image Process.
- ICASSP
- IEEE Access
- Expert Syst. Appl.
- IGARSS
- J. Electronic Imaging
- Medical Imaging: Computer-Aided Diagnosis
- EUSIPCO
- Neurocomputing
- IEEE Trans. Pattern Anal. Mach. Intell.
- ISBI
- Medical Imaging: Image Processing
- CVPR
- ICIP (3)
- Image Vis. Comput.
- IEEE Signal Process. Lett.
- BMVC
- Remote. Sens.
- EMBC
- CIARP
- Inf. Sci.
- IET Image Process.
- J. Vis. Commun. Image Represent.
- Sensors
- IEEE Trans. Geosci. Remote. Sens.
- IJCNN
- Vis. Comput.
- Comput. Graph. Forum
- SIU
- Signal Process.
- ACM Trans. Graph.
- Pattern Anal. Appl.
- SCIA
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