SCALE INVARIANT
Experts
- Tony Lindeberg
- Matti Pietikäinen
- Jean-Michel Morel
- Bart M. ter Haar Romeny
- Luc Florack
- Cordelia Schmid
- Andrew Zisserman
- Richard W. Harvey
- J. Andrew Bangham
- Kim Steenstrup Pedersen
- Atsushi Imiya
- Max A. Viergever
- Alexander Wong
- Madhu Sudan
- Songde Ma
- Joachim Weickert
- Marco Loog
- Robert F. Murphy
- Klaus D. McDonald-Maier
- Shoaib Ehsan
- Tomoya Sakai
- Krystian Mikolajczyk
- Bhabatosh Chanda
- Guoying Zhao
- James L. Crowley
- Andreas Uhl
- Marc W. Howard
- Alberto Del Bimbo
- Zhi Liu
- Jitendra Malik
- Arjan Kuijper
- Stefano Berretti
- Luc Van Gool
- Paul W. Fieguth
- V. Javier Traver
- Pietro Perona
- Alfons H. Salden
- Jan J. Koenderink
- J. M. Hans du Buf
Venues
- CoRR
- ICIP
- CVPR
- IEEE Trans. Image Process.
- ICPR
- IEEE Trans. Pattern Anal. Mach. Intell.
- IEEE Access
- Pattern Recognit.
- ICASSP
- Multim. Tools Appl.
- ICCV
- Sensors
- Pattern Recognit. Lett.
- Scale-Space
- Remote. Sens.
- Neurocomputing
- BMVC
- Int. J. Comput. Vis.
- J. Math. Imaging Vis.
- Image Vis. Comput.
- SSVM
- CVPR Workshops
- EMBC
- ICRA
- IGARSS
- ISBI
- J. Vis.
- Expert Syst. Appl.
- IEEE Geosci. Remote. Sens. Lett.
- EUSIPCO
- J. Electronic Imaging
- ICME
- Comput. Vis. Image Underst.
- Mach. Vis. Appl.
- IROS
- ISCAS
- Medical Imaging: Image Processing
- J. Vis. Commun. Image Represent.
- IEEE Trans. Geosci. Remote. Sens.
Related Topics
Related Keywords
Popularity
No popularities found. Try to change the filters.
Popularity Trend