SCALE INVARIANT
Experts
- Tony Lindeberg
- Matti Pietikäinen
- Bart M. ter Haar Romeny
- Jean-Michel Morel
- Luc Florack
- Cordelia Schmid
- Andrew Zisserman
- Richard W. Harvey
- J. Andrew Bangham
- Atsushi Imiya
- Max A. Viergever
- Kim Steenstrup Pedersen
- Madhu Sudan
- Alexander Wong
- Klaus D. McDonald-Maier
- Songde Ma
- Robert F. Murphy
- Krystian Mikolajczyk
- Shoaib Ehsan
- Marco Loog
- Tomoya Sakai
- Joachim Weickert
- James L. Crowley
- Guoying Zhao
- Bhabatosh Chanda
- Alberto Del Bimbo
- Marc W. Howard
- Andreas Uhl
- Zhi Liu
- Jitendra Malik
- Arjan Kuijper
- Stefano Berretti
- Luc Van Gool
- Paul W. Fieguth
- Alfons H. Salden
- Xiang Bai
- Eero P. Simoncelli
- V. Javier Traver
- Arnab Bhattacharyya
Venues
- CoRR
- ICIP
- CVPR
- IEEE Trans. Image Process.
- ICPR
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICASSP
- Pattern Recognit.
- Multim. Tools Appl.
- IEEE Access
- ICCV
- Pattern Recognit. Lett.
- Scale-Space
- Sensors
- Neurocomputing
- Remote. Sens.
- BMVC
- Int. J. Comput. Vis.
- Image Vis. Comput.
- SSVM
- J. Math. Imaging Vis.
- EMBC
- CVPR Workshops
- IGARSS
- ISBI
- ICRA
- J. Vis.
- IEEE Geosci. Remote. Sens. Lett.
- EUSIPCO
- Expert Syst. Appl.
- J. Electronic Imaging
- Mach. Vis. Appl.
- Comput. Vis. Image Underst.
- ICME
- ISCAS
- IROS
- Medical Imaging: Image Processing
- J. Vis. Commun. Image Represent.
- SMC
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