FEATURE DESCRIPTORS
Experts
- Matti Pietikäinen
- Guoying Zhao
- Alberto Del Bimbo
- Wen Gao
- William Robson Schwartz
- João Batista Florindo
- Dah-Jye Lee
- Xuelong Li
- Mohammed Bennamoun
- Liming Chen
- Ling Shao
- Cordelia Schmid
- Li Liu
- Hongxun Yao
- Loris Nanni
- Qi Tian
- Shuicheng Yan
- Vijay Chandrasekhar
- Yunhong Wang
- Shiv Ram Dubey
- Odemir Martinez Bruno
- Hélio Pedrini
- Takio Kurita
- Paul W. Fieguth
- Pavel Král
- Alok Desai
- Shervan Fekri Ershad
- Muhammad Hussain
- Stefano Berretti
- Di Huang
- Shekhar Karanwal
- Abdenour Hadid
- Alessandra Lumini
- Fabio Bellavia
- Timo Ojala
- Stefano Soatto
- Tomasz Trzcinski
- Yu Qiao
- Xianbiao Qi
Venues
- CoRR
- ICIP
- Multim. Tools Appl.
- ICPR
- IEEE Access
- CVPR
- Pattern Recognit.
- Neurocomputing
- Pattern Recognit. Lett.
- IEEE Trans. Image Process.
- ICASSP
- Sensors
- Remote. Sens.
- J. Vis. Commun. Image Represent.
- BMVC
- IEEE Trans. Geosci. Remote. Sens.
- IEEE Geosci. Remote. Sens. Lett.
- IEEE Trans. Pattern Anal. Mach. Intell.
- Expert Syst. Appl.
- IGARSS
- IROS
- ICCV
- J. Electronic Imaging
- SMC
- ICRA
- Vis. Comput.
- IEICE Trans. Inf. Syst.
- IEEE Signal Process. Lett.
- EUSIPCO
- INTERSPEECH
- IET Image Process.
- Comput. Vis. Image Underst.
- Image Vis. Comput.
- ISBI
- CVPR Workshops
- MVA
- IEEE Trans. Circuits Syst. Video Technol.
- IEEE J. Sel. Top. Appl. Earth Obs. Remote. Sens.
- ICME
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