Diagnosing Transition Delay Faults under Scan-Based Logic Array.
Duo-Yao KangShiou-Ning LinKuen-Jong LeePublished in: ITC-Asia (2022)
Keyphrases
- model based diagnosis
- built in self test
- random access memory
- digital circuits
- fault models
- fault diagnosis
- classical logic
- automated reasoning
- modal logic
- logic programming
- dynamic systems
- predicate logic
- fault model
- fault detection
- neural network
- epistemic logic
- programmable logic
- scan data
- test cases
- multiple faults
- high speed