Delay Testing of MOS Transistor with Gate Oxide Short.

Michel Renovell Jean Marc Gallière Florence Azaïs Yves Bertrand

Published in: Asian Test Symposium (2003)

Keyphrases

silicon dioxide
leakage current
field effect transistors
low voltage
electrical properties
high temperature
power dissipation
test cases
power line
steady state
high speed
high density
fuel cell
flip flops
real time
cmos technology
multiple input
database