Reliability Aware Gate Sizing Combating NBTI and Oxide Breakdown.
Subhendu RoyDavid Z. PanPublished in: VLSI Design (2014)
Keyphrases
- leakage current
- low voltage
- silicon dioxide
- electrical properties
- power line
- reliability analysis
- field effect transistors
- highly reliable
- three dimensional
- failure rate
- data sets
- software reliability
- database
- web spam
- electron microscopy
- high density
- high speed
- multiscale
- reliability assessment
- e learning
- genetic algorithm
- neural network