Detecting Star Cracks in Topography Images of Specular Back Surfaces of Structured Wafers.
Corinna KoflerRobert MuhrGunter SpöckPublished in: ICMLA (2018)
Keyphrases
- three dimensional
- surface reflectance
- object recognition
- image database
- light source
- image data
- surface properties
- input image
- real objects
- multiple images
- range data
- specular highlights
- surface shape
- computer graphics
- image retrieval
- image registration
- digital images
- illumination conditions
- lighting conditions
- textured surfaces
- reflectance properties
- feature points
- image processing
- complex scenes
- edge detection
- surface reconstruction
- stereo reconstruction
- photometric stereo
- specular surfaces
- reflectance model
- shape from shading
- face recognition
- photometric properties