A high-speed test-generation method using a test generation circuit.

Fumiyasu Hirose Koichiro Takayama Nobuaki Kawato

Published in: Systems and Computers in Japan (1990)

Keyphrases

test generation
high speed
generation method
test cases
test sequences
low power
mutation testing
symbolic execution
software testing
code coverage
quality assurance
static analysis
real time
test data generation
design automation
image processing
machine vision
regression testing
object oriented
machine learning