Testing high resolution SigmaDelta ADC's by using the quantizer input as test access.
Daniela De VenutoPublished in: Microelectron. J. (2005)
Keyphrases
- high resolution
- test cases
- low resolution
- software testing
- test data
- test sequences
- image processing
- test suite
- regression testing
- image compression
- statistical tests
- testing process
- super resolution
- coding scheme
- high quality
- vector quantization
- test generation
- field of view
- remote sensing
- step size
- set of test cases
- test case generation
- model based testing
- test data generation
- item response theory
- sonar images
- high frequency
- access control
- input data
- face recognition