Accelerating post silicon debug of deep electrical faults.
Bao LeDipanjan SenguptaAndreas G. VenerisZissis PoulosPublished in: IOLTS (2013)
Keyphrases
- fault diagnosis
- high speed
- fault detection
- normal operation
- low cost
- electrical properties
- distribution networks
- plasma etching
- power distribution
- real time
- model based diagnosis
- transmission line
- power grid
- short circuit
- computer engineering
- engineering and computer science
- root cause
- fault detection and diagnosis
- deep learning
- high density
- test cases
- data sets