Configurable Thru-Silicon-Via interconnect Built-In Self-Test and diagnosis.
Vladimir PascaLorena AnghelMounir BenabdenbiPublished in: LATW (2011)
Keyphrases
- high speed
- built in self test
- model based diagnosis
- medical diagnosis
- fault diagnosis
- model based reasoning
- high density
- low cost
- fault detection
- integrated circuit
- diagnostic reasoning
- clinically relevant
- medical diagnostic
- multiple faults
- real time
- attention deficit hyperactivity disorder
- diagnostic tests
- image processing
- gallium arsenide
- space charge
- breast cancer diagnosis
- liquid crystal
- causal reasoning
- health care