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Delay Test Scan Flip-Flop: DFT for High Coverage Delay Testing.

Gefu XuAdit D. Singh
Published in: VLSI Design (2007)
Keyphrases
  • test suite
  • software testing
  • test generation
  • test cases
  • code coverage
  • test data
  • statistical tests
  • power dissipation
  • set of test cases
  • video sequences
  • hidden markov models
  • frequency domain
  • testing process