Testing DSM ASIC With Static, \DeltaIDDQ, And Dynamic Test Suite: Implementation And Results.
Yoshihito NishizakiOsamu NakayamaChiaki MatsumotoYoshitaka KimuraToshimi KobayashiHiroyuki NakamuraPublished in: ITC (2003)
Keyphrases
- test suite
- test cases
- dynamic analysis
- static analysis
- regression testing
- test suite reduction
- model based testing
- testing process
- software testing
- mutation testing
- test case generation
- number of test cases
- hardware implementation
- test generation
- efficient implementation
- test sequences
- hardware architecture
- design methodology
- low cost
- circuit design
- integrated circuit
- relational databases
- neural network
- test data
- dynamic routing
- application specific
- software maintenance
- data sets